*** Please excuse multiple postings *** GI/ITG/GMA Technical Committee “Dependability and Fault Tolerance” Call for Papers, 16th Workshop on Dependability and Fault Tolerance (VERFE 2021) in conjunction with 33rd ARCS 2021, virtual, June, 2021 Background and Focus: Although the basic reliability of hardware and software components has improved over decades, their increasing number causes severe problems. Moreover, in recent years it can be observed that an increasing number of devices are integrated into environments of other physical components such as cars or digital systems. Here, the complexity and number of interactions with these components creates problems with regard to maintaining a dependable operation of the entire system in case of faults or external disturbances. While this is not a problem with microprocessors, shrinking feature sizes, higher complexity, lower voltages, and higher clock frequencies increase the probability of design-, manufacturing-, and operational faults, making fault tolerance techniques in general purpose processors to be of crucial importance in the future. As simple solutions (such as TMR) can easily get too expensive, the ability to trade increased reliability against performance/power overhead will become important, resulting in light-weight fault tolerance techniques implemented in hardware, but controllable from higher software layers. This workshop aims at presenting contributions and work-in-progress from the research area of dependable and fault-tolerant computing in order to bring together scientists working in related fields. Topics Contributions on the topic of “Dependable Embedded Systems“ are of particular interest; contributions on general topics of dependability and fault tolerance are also welcome but not limited to: • dependable computer systems, networks and embedded systems • dependability of mechatronic systems • fault-tolerant systems and system components • safety-critical applications • highly available systems • real-time and performance guarantees • testing of hardware and software • fault detection and fault treatment • failure prediction • modeling, simulation and evaluation of fault-tolerant systems • reliability models for hardware and software • validation and verification • fault models and fault abstraction • fault injection techniques • on-chip fault-tolerance • software-controlled fault tolerance • fault-tolerant processor architecture • fault-tolerance in operating systems, storage and database systems The workshop will focus on research presentations as well as brainstorming sessions. Therefore, two kinds of contributions are welcome: * research papers documenting results of scientific investigations and * position papers proposing strategies or discussing open problems. Accepted papers will be published by VDE and IEEExplore. Papers should be in English and formatted according to IEEE eXpress ”conference mode”. Selected papers will appear in the FERS Journal (ISSN 0724-5319). Deadlines: Submission: *** EXTENDED *** April 30th, 2021 (ext. abstracts (3-4 pages) or full papers (max. 8 pages), PDF) to: bernhard.fechner@fernuni-hagen.de Notification: May 10th, 2021 Camera-ready: May 24th, 2021 (max. 8 pages) Workshop Chairs Bernhard Fechner FernUniversität in Hagen Germany Peter Sobe HTW Dresden Germany Karl-Erwin Großpietsch St. Augustin Germany Program Committee Lars Bauer Karlsruhe Institute of Technology Germany Fevzi Belli University of Paderborn Germany Greg Bronevetsky X the moonshot factory USA Rainer Buchty TU Braunschweig Germany Klaus Echtle University of Duisburg-Essen Germany Wolfgang Ehrenberger University of Fulda Germany Rolf Ernst TU Braunschweig Germany Bernhard Fechner University of Hagen Germany Michael Gössel University of Potsdam Germany Jörg Henkel Karlsruhe Institute of Technology Germany John Hursey Oak Ridge National Laboratory USA Jörg Keller FernUniversität in Hagen Germany Hans-Dieter Kochs University of Duisburg-Essen Germany Minh Lê Siemens AG Nuremberg Miroslaw Malek USI-Lugano Switzerland Erik Maehle University of Lübeck Germany Michael Mock Fraunhofer St. Augustin Dimitris Nikolos University of Patras Greece Francesca Saglietti University of Erlangen-Nuremberg Germany Toshi Sato University of Fukuoka Japan Martin Schulz TU Munich Germany Muhammad Shafique TU Vienna Austria Peter Sobe HTW Dresden Germany Janusz Sosnowski University of Warsaw Poland Carsten Trinitis TU Munich Germany Peter Tröger TU Chemnitz Germany Heinrich Theodor Vierhaus TU Cottbus Germany Max Walter Siemens AG Nuremberg Norbert Wehn TU Kaiserslautern Germany Josef Weidendorfer TU Munich Germany Sebastian Zug TU Freiberg Germany